Smart sensor properties at a glance. (Source: Maiwald; Vortrag auf dem 11. Kolloquium Prozessanalytik)
Process Analysis Technology

Why PAT Must Come Out of the Silo

The 11th colloquium on Process Analytics was held in the historical dome hall of TU Vienna under this motto. The nearly 200 participants were unanimous: process analytics must come out of the ivory tower and finally shed the perception of complexity. How is this to happen? How will the much admired trialogue between device manufacturers, science and industrial users be wrapped up finally?

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