FlipView Pittcon 2012

Correlative Microscopy, Coupling Image Data with Chemical Composition

Correlative microscopy has been around for decades -- Now there is a new approach to this method. Recent units allow for a coupling of the microscopic image with the chemical properties of the sample. At Pittconn 2012 we had the chance to talk to Donna Guarrera, Assisant Director of Jeol's SM Division, about new trends in correlative microscopy and their application in different industries.
Jeol is a manufacturer of electron microscopes used in naotechnology. The line ranges from ultra-high resolution, analytical field emission Scanning Electron Microscopes (SEMs) to benchtop SEMs and an atmospheric microscope, one of many cerrelative microscopy solutions the company offers. Last year Jeol introduced a portable, research grade, analytical SEM with multi-touch control.