powered by: Leica Mikrosysteme Vertrieb GmbH
Are you interested in reading interesting applications of ion beam milling, take a look at this specially prepared booklet. Specialists from Leica Microsystems have collected over 20 different examples featuring different samples for SEM.
Today, ion beam milling is one of the most widely-used methods for preparing samples for electron microscopy. During this process, the sample material is bombarded with a high-energy argon-ion beam to achieve high quality cross-sections and polished surfaces whilst minimizing deformation or damage. Did you know that it is possible to create high-quality cross-sections through a touchscreen to display all layers - polymer layer, layers of adhesive and glass substrate? Did you ever try to display the grain boundaries and substructures in the grains of synthetic rock salt?
The booklet offers over 20 different examples featuring different samples for SEM:
By clicking on the button I agree that Vogel transmits my data to the above mentioned provider of this offer and that he uses my data for the advertising of his product also by email, telephone and fax. For this purpose he receives my address and contact data, as well as data to prove this consent, which he processes on his own responsibility.
You have the right to revoke this consent at any time with effect for the future. Please use the following contact option:
If the responsible recipient is located in a country outside the EU, we must inform you that the level of data protection may be lower than in the EU.
Further information from the responsible person regarding the handling of personal data can be found here: https://www.leica-microsystems.com/company/privacy-policy/
Published: 09/10/2018 | Leica Mikrosysteme Vertrieb GmbH